Lens Multilayer Structure Pitch Measurement

Lens Multilayer Structure Pitch Measurement

SinceVision's SCI01045 sensor ensures precise, non-contact lens pitch measurement for mobile phone glass, boosting electronics manufacturing efficiency.

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In the electronics industry, the thickness and uniformity of mobile phone glass and lens multilayer structures directly impact screen display quality, overall device thinness, and performance. Manufacturers face significant challenges, including:


1. Ensuring precise thickness control to maintain optical clarity and structural integrity, as even minor deviations can compromise display quality.

2. Achieving high-speed, non-contact measurements to meet production demands without damaging delicate materials.

3. Maintaining consistency and accuracy across large-scale manufacturing processes to meet stringent industry standards.


SinceVision Solutions: SCI01045 Spectral Confocal Displacement Sensor

01Real-Time, High-Precision Measurement: With a measuring range of 1mm, project accuracy of 2μm, and linearity of ±0.02% F.S., the SCI01045 delivers ultra-precise, non-contact thickness measurements for mobile phone glass and lens structures, ensuring optimal display quality and device performance.

02Efficient Single-Head Solution: This sensor enables fast, reliable measurements in real time, boosting production efficiency and reducing downtime while maintaining material integrity.

03High Accuracy for Industry Standards: Its advanced spectral confocal technology ensures uniformity and precision, meeting the stringent demands of the electronics and semiconductor industry for consistent, high-quality outputs.


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