In semiconductor testing, a range of specialized equipment, including sorters, probe stations, testers, optical microscopes, and defect observation devices, facilitates various stages of the process. Among these, sorters are essential for chip design validation and final testing, ensuring product quality and performance.

Challenges include:

 Precision and Speed: The rapid movement of tiny components makes observing results with standard equipment impractical.

 Space Limitations: Constrained spaces within testing devices require compact, specialized tools.

 Data Collection: Real-time high-resolution footage is needed for accurate analysis and defect detection.